DocumentCode :
3453081
Title :
Thickness histogram and statistical harmonic representation for 3D model retrieval
Author :
Yi Liu ; Pu, Jiantao ; Zha, Hongbin ; Liu, Weibin ; Uehara, Yusuke
Author_Institution :
Nat. Lab. on Machine Perception, Peking Univ., Beijing, China
fYear :
2004
fDate :
6-9 Sept. 2004
Firstpage :
896
Lastpage :
903
Abstract :
Similarity measuring is a key problem for 3D model retrieval. We propose a novel shape descriptor "thickness histogram" (TH) by uniformly estimating thickness of a model using statistical methods. It is translation and rotation-invariant, discriminative to different shapes, and very efficient to compute with the shape distribution (SD) proposed by Osada etc. For high performance of the retrieval, we propose a robust method for translating the directional form of the statistical distribution to the harmonic representation. By summing up energies at different frequencies, a matrix shape signature is formed to provide an exhaustive characterization of 3D geometry. Experiments show that the performance of the statistical harmonic representation is among the top ones of existing shape descriptors.
Keywords :
computational geometry; content-based retrieval; feature extraction; fractals; solid modelling; statistical distributions; visual databases; 3D geometry; 3D model retrieval; matrix shape signature; shape distribution; similarity measuring; statistical distribution method; statistical harmonic representation; thickness histogram; Feature extraction; Frequency; Geometry; Histograms; Internet; Laboratories; Principal component analysis; Robustness; Shape; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
3D Data Processing, Visualization and Transmission, 2004. 3DPVT 2004. Proceedings. 2nd International Symposium on
Print_ISBN :
0-7695-2223-8
Type :
conf
DOI :
10.1109/TDPVT.2004.1335410
Filename :
1335410
Link To Document :
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