Title :
How to avoid TRAPATT oscillations at the reverse-recovery of power diodes
Author :
Kaschani, K.T. ; Sittig, R.
Author_Institution :
Inst. fur Elektrophys., Tech. Univ. Braunschweig, Germany
Abstract :
For optimization of p-i-n type power diodes a minimization of base width is proposed. It is found, however, that the reverse-recovery characteristic of such devices is extremely prone to undesirable TRAPATT oscillations. Therefore a detailed analysis of the fundamental effects leading to these oscillations is carried out, in order to take appropriate measures for avoidance. As a result a design of p-i-n type power diodes is developed, which shows excellent features for overvoltage limitation
Keywords :
equivalent circuits; oscillations; overvoltage; p-i-n diodes; power semiconductor diodes; TRAPATT oscillations; overvoltage limitation; p-i-n type; power diodes; reverse-recovery; Diodes; Electric breakdown; Impact ionization; Impurities; Inductors; Stress; Surges; Switches; Switching loss; Voltage;
Conference_Titel :
Semiconductor Conference, 1995. CAS'95 Proceedings., 1995 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-2647-4
DOI :
10.1109/SMICND.1995.495081