• DocumentCode
    3454228
  • Title

    SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems

  • Author

    Lin, Yang ; Zwolinski, Mark

  • Author_Institution
    Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
  • fYear
    2012
  • fDate
    27-29 June 2012
  • Firstpage
    7
  • Lastpage
    12
  • Abstract
    Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs are detected by monitoring the illegal transitions at the output of a flip-flop and recovered by inverting the cell state. SETs, timing errors and the other SEUs are detected by a time redundancy-based architecture. For a 10% activity rate, SETTOFF consumes 35.8% and 39.7% more power than a library flip-flop in 120nm and 65nm technologies, respectively. It only consumes about 5.7% more power than the detection based RazorII flip-flop [1]. SETTOFF therefore provides an increased coverage of fault tolerance with only moderate increase in overhead, hence it is suitable for building highly reliable systems at lower cost than the traditional techniques.
  • Keywords
    fault tolerance; flip-flops; redundancy; SET; SETTOFF; SEU; cell state; cost-efficient architecture; cost-efficient reliable systems; detection-based RazorII flip-flop; fault tolerant flip-flop; illegal transitions; library flip-flop; soft errors; time redundancy-based architecture; timing errors; Clocks; Computer architecture; Delay; Fault tolerant systems; Latches; Logic gates; Fault tolerance; single-event transient; single-event upset; timing error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
  • Conference_Location
    Sitges
  • Print_ISBN
    978-1-4673-2082-5
  • Type

    conf

  • DOI
    10.1109/IOLTS.2012.6313833
  • Filename
    6313833