Full-field imaging techniques for the molecular analysis of complex materials

Author

Mackey, J.R. ; Salari, E.

fYear

2001

fDate

11-11 May 2001

Firstpage

464

Abstract

Summary form only given. We have demonstrated a non-invasive fall-field phase-modulated instrument for measuring material properties, fluid flow parameters, stress, strain and molecular structure of optically active materials. A fall-field measurement technique is absolutely necessary in order to obtain science information over an entire sample at one time. Quantitative stress and strain measurements can be obtained in this manner.

Keywords

CCD image sensors; image processing; liquid crystal devices; mechanical birefringence; molecular configurations; molecular orientation; nondestructive testing; optical modulation; optical polarisers; optical rotation; strain measurement; stress measurement; CCD array; complex materials; fall-field measurement technique; fluid flow parameters; full-field imaging techniques; image analysis techniques; liquid crystal variable retardation plate; molecular analysis; molecular structure; noninvasive fall-field phase-modulated instrument; optically active materials; polarization state modulator; polarized light; science information; strain measurement; stress measurement; Fluid flow; Fluid flow measurement; Image analysis; Instruments; Material properties; Optical imaging; Optical materials; Phase measurement; Strain measurement; Stress measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

Baltimore, MD, USA

Print_ISBN

1-55752-662-1

Type

conf

DOI

10.1109/CLEO.2001.948047

Filename

948047