DocumentCode
3454656
Title
Measurement and modelling of monolithic IC´s from 30-100 GHz
Author
Pearson, G.A. ; Lang, R.J.
Author_Institution
Thomson-Thorn Missile Electron., Hayes, UK
fYear
1995
fDate
35037
Firstpage
42461
Lastpage
42466
Abstract
This paper addresses the measurement and modelling of monolithic microstrip devices and circuits at frequencies from 30-100 GHz. The development of custom Line-Reflect-Line (LRL) on-wafer microstrip calibration standards to 100 GHz is discussed, and compared with off-wafer Coplanar Waveguide (CPW) standards. Examples of measurements to 40 GHz are discussed for monolithic diode and HEMT devices, along with examples of a variety of circuits operating at Ka-band and W-band, including in particular a W-band push-push oscillator
Keywords
MIMIC; calibration; coplanar waveguides; integrated circuit modelling; integrated circuit testing; measurement standards; microstrip circuits; millimetre wave measurement; 30 to 100 GHz; EHF; Ka-band; LRL calibration standards; MIMIC; W-band; coplanar waveguide standards; line-reflect-line calibration standards; modelling; monolithic ICs; monolithic microstrip devices; offwafer CPW standards; onwafer microstrip calibration standards;
fLanguage
English
Publisher
iet
Conference_Titel
Terahertz Technology, IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19951486
Filename
495122
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