DocumentCode :
3454794
Title :
Architectural vulnerability aware checkpoint placement in a multicore processor
Author :
Lotfi, Atieh ; Bayat, Arash ; Safari, Saeed
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear :
2012
fDate :
27-29 June 2012
Firstpage :
118
Lastpage :
120
Abstract :
As the system complexity increases, the failure probability increases substantially. Therefore, the system requires techniques for supporting fault tolerance. Checkpointing technique is widely used to reduce the execution time of long-running programs in presence of failures and enhancing the reliability of such systems. Several methods were studied thus far in order to determine the checkpointing interval which optimizes system performance. The crucial parameter in all of these solutions is system failure model which is primarily assumed as exponential or Weibull distributions. But, these models are not perfectly accurate since they fail to model the effect of soft errors. In this paper, we introduce a more realistic failure model based on the processors AVF. In addition, we propose three checkpoint placement methods with constant and variable intervals that determine suitable checkpoint places for the proposed failure model. Our experimental results show that our method, which is implementable on any multicore system, can find the suitable points in which checkpoints should be taken.
Keywords :
Weibull distribution; checkpointing; exponential distribution; failure analysis; fault tolerance; multiprocessing systems; AVF processors; Weibull distributions; architectural vulnerability aware checkpoint placement; exponential distributions; failure probability; fault tolerance; long-running programs; multicore processor; soft errors; system failure model; system performance optimization; systems reliability; Checkpointing; Computational modeling; Equations; Error analysis; Mathematical model; Multicore processing; Processor scheduling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location :
Sitges
Print_ISBN :
978-1-4673-2082-5
Type :
conf
DOI :
10.1109/IOLTS.2012.6313852
Filename :
6313852
Link To Document :
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