Title :
Design for testability strategies for mixed signal & analogue designs-from layout to system
Author :
Richardson, Andrew ; Lechner, A. ; Olbrich, Thomas
Author_Institution :
Microelectron. Res. Group, Lancaster Univ., UK
Abstract :
The cost and complexity of mixed signal and analogue production test programs is lending to considerable interest in Design for testability (DfT) techniques that have the potential to improve testability by reducing implementation cost and improving outgoing quality. These techniques range from rules and guidelines for schematic and physical design to full built-in-self-test (BIST) solutions. This paper presents a summary of a number of possible DfT approaches that may well help to solve test cost and test quality difficulties for analogue and mixed signal integrated circuits
Keywords :
analogue integrated circuits; automatic testing; built-in self test; design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; BIST; DFT strategies; analogue designs; built-in-self-test; design for testability strategies; integrated circuits; mixed signal designs; production test; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Cost function; Design for testability; Electronic equipment testing; Guidelines; Signal design; System testing;
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
DOI :
10.1109/ICECS.1998.814914
