DocumentCode
345579
Title
Observing beam motion using infrared interferometry
Author
Byrd, J.M. ; Martin, M. ; McKinney, W.
Author_Institution
Lawrence Berkeley Lab., CA, USA
Volume
1
fYear
1999
fDate
1999
Firstpage
495
Abstract
Phase noise in the RF master oscillator driving synchrotron oscillations of the beam has been identified as one of the dominant sources of noise in the infrared beamline at the Advanced Light Source. We present measurements of the effect of the electron beam motion in a Fourier transform interferometer (FTIR) detector. This form of detector may be sensitive to very small beam motions
Keywords
Fourier transforms; electromagnetic wave interferometry; electron accelerators; particle beam diagnostics; storage rings; ALS; Advanced Light Source; Fourier transform interferometer detector; RF master oscillator; electron beam motion; infrared beamline; infrared interferometry; synchrotron oscillations; Electron beams; Light sources; Motion detection; Motion measurement; Optical interferometry; Oscillators; Phase noise; Radio frequency; Radiofrequency identification; Synchrotrons;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location
New York, NY
Print_ISBN
0-7803-5573-3
Type
conf
DOI
10.1109/PAC.1999.795742
Filename
795742
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