Title :
Cd1-xZnxTe gamma ray detectors
Author :
Butler, J.F. ; Lingren, C.L. ; Doty, F.P.
Author_Institution :
Aurora Technologies Corp., San Diego, CA, USA
Abstract :
Results of an effort to improve the performance of CdTe detectors by addressing starting element purity and crystallinity are described. Structural perfection was improved by alloying with ZnTe to form crystals of Cd/sub 1-x/Zn/sub x/Te. Crystals were grown by a high-pressure Bridgman method. Evidence for significant enhancements of the mu tau products resulting from these efforts is presented. Features of Cd/sub 0.8/Zn/sub 0.2/Te detectors include energy resolutions at 122 keV <7%, a resistivity of approximately 10/sup 11/ Omega -cm, no polarization effects, and temperatures for useful operation up to 100 degrees C. The large sizes (e.g., 3 kg, 7.5-cm diameter) and excellent homogeneity of the crystals make it possible to produce detectors and imaging arrays with areas of several square inches.<>
Keywords :
II-VI semiconductors; gamma-ray detection and measurement; semiconductor counters; 100 degC; 122 keV; 3 kg; 7.5 cm; Cd/sub 1-x/Zn/sub x/Te gamma ray detectors; crystallinity; energy resolutions; high-pressure Bridgman method; imaging arrays; mv tau products; purity; resistivity; Alloying; Conductivity; Crystallization; Crystals; Detectors; Energy resolution; Polarization; Tellurium; Temperature; Zinc compounds;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
DOI :
10.1109/NSSMIC.1991.258906
