DocumentCode :
3456617
Title :
Physics-topological design of GaAs field-effect transistors with a Schottky barrier
Author :
Krutov, A.V. ; Mitlin, V.A. ; Rebrov, A.S.
Author_Institution :
SRPC Istok, Russia
fYear :
1999
fDate :
13-16 Sept. 1999
Firstpage :
69
Lastpage :
71
Abstract :
In this paper the results of physics-topological design of GaAs field-effect transistors with a Schottky barrier (MESFET) are presented. A linear process and physics-based MESFET model were used for the design. A distinctive feature of the model is that the output parameters of the designed device can be forecast before its manufacture and measurement of the microwave parameters. The questions concerning the influence of the fundamental technological factors are surveyed: channel doping density and electron mobilities; the geometrical dimensions of the transistor; gate lengths, fingers width and quantity. The parameters of the MESFET equivalent circuit and maximum available gain of the transistor in a frequency band are deduced. The good coincidence of calculated and measured parameters is shown.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; equivalent circuits; gallium arsenide; microwave field effect transistors; semiconductor device models; GaAs; MESFET equivalent circuit; channel doping density; electron mobilities; gate length; geometrical dimensions; maximum available gain; microwave parameters; physical-topological design; physics-based MESFET model; FETs; Gallium arsenide; MESFETs; Microwave devices; Microwave measurements; Microwave transistors; Predictive models; Schottky barriers; Semiconductor process modeling; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1999. Microwave & Telecommunication Technology. 1999 9th International Crimean [In Russian with English abstracts]
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-572-003-1
Type :
conf
DOI :
10.1109/CRMICO.1999.815147
Filename :
815147
Link To Document :
بازگشت