Title :
Development of a monolithic constant fraction discriminator
Author :
Tanaka, Manobu ; Ikeda, Hirokazu ; Ikeda, Mitsuo ; Inaba, Susumu
Author_Institution :
Nat. Lab. for High Energy Phys., Ibaraki, Japan
Abstract :
A constant fraction (CF) discriminator was developed with a bipolar application-specific integrated circuit (ASIC) technology from NEC. Prototype chips were examined for their integrity and performance. It is concluded that this technology has significant advantages over others in use for applications in high-density integration, and particularly for some large-scale experiments such as the B-factory and the Superconducting Super Collider (SSC). The performance of this differentiated CF integrated circuit was tested. The function of the differentiation CF discriminator (DCFD) IC was exactly what was expected, and the full width of the time walk was 1 ns or less.<>
Keywords :
application specific integrated circuits; discriminators; nuclear electronics; ASIC; B-factory; DCFD; NEC; SSC; Superconducting Super Collider; bipolar application-specific integrated circuit; differentiated CF integrated circuit; differentiation CF discriminator; full width; high-density integration; integrity; large-scale experiments; monolithic constant fraction discriminator; performance; prototype chips; time walk; Analog integrated circuits; Attenuators; Bipolar integrated circuits; Computational fluid dynamics; Delay; Laboratories; National electric code; Prototypes; Timing; Wideband;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
DOI :
10.1109/NSSMIC.1991.259010
