DocumentCode :
3459768
Title :
Optimized impedance standard substrate designs for dual and differential applications
Author :
Lesher, Tim ; Hayden, Leonard ; Strid, Eric
Author_Institution :
Cascade Microtech Inc., Beaverton, OR, USA
fYear :
2003
fDate :
4-5 Dec. 2003
Firstpage :
197
Lastpage :
200
Abstract :
Optimized dual signal Impedance Standard Substrate (ISS) designs are demonstrated. The optimal designs had loop-under grounds, were selected for minimum deviation from lumped element behavior and used mode dampening structures. A comparison of existing design approaches is given and the quality of the designs is illustrated to 50 GHz.
Keywords :
electric impedance measurement; microwave measurement; millimetre wave measurement; network analysers; probes; standards; substrates; 50 GHz; differential applications; dual applications; dual signal impedance standard substrate; loop-under grounds; lumped element behavior; mode dampening structures; optimal designs; optimized impedance standard substrate designs; Calibration; Coplanar waveguides; Design optimization; Impedance; Microstrip; Probes; Signal design; Slotline; Substrates; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Print_ISBN :
0-7803-8195-5
Type :
conf
DOI :
10.1109/ARFTGF.2003.1459773
Filename :
1459773
Link To Document :
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