Title :
The CPFSK dual-mode error correction decoding technique over the burst-error channel
Author :
Chung, Jong-Moon ; Park, Sung-Kyung ; Kang, Chang Eon ; Cheong, Ho-Young
Author_Institution :
Dept. of Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
This paper presents an error correcting adaptive decoding dual-mode algorithm as it is adapted to the continuous phase frequency shift keying (CPFSK) modulation. The dual-mode error correcting algorithm consists of two modes which utilizes the maximum likelihood decoding technique and the burst-error detection scheme. The first mode is the random error correcting mode, which is the Viterbi decoder, and the second mode is the burst-error correcting mode that retrieves the information bits from the (L+m) delayed signal values of the received signals. The dual-mode adaptive decoder nominally operates as a Viterbi decoder and switches to time diversity error recovery, the burst-error correcting mode, whenever the decoder detects an incorrigible error pattern. The experimental results from the computer simulation demonstrate the performance of the algorithm and verify the theoretical results
Keywords :
Viterbi decoding; adaptive decoding; continuous phase modulation; error correction codes; error detection codes; frequency shift keying; maximum likelihood decoding; CPFSK dual-mode error correction decoding technique; Viterbi decoder; burst-error channel; burst-error correcting mode; burst-error detection; continuous phase frequency shift keying; error correcting adaptive decoding dual-mode algorithm; incorrigible error pattern; information bit; maximum likelihood decoding; performance; random error correcting mode; time diversity error recovery; Computer errors; Continuous phase modulation; Delay; Error correction; Frequency shift keying; Information retrieval; Maximum likelihood decoding; Maximum likelihood detection; Switches; Viterbi algorithm;
Conference_Titel :
Networks, 1995. Theme: Electrotechnology 2000: Communications and Networks. [in conjunction with the] International Conference on Information Engineering., Proceedings of IEEE Singapore International
Print_ISBN :
0-7803-2579-6
DOI :
10.1109/SICON.1995.526069