• DocumentCode
    3461276
  • Title

    Simulation of damage in materials subject to radiation by energetic ions

  • Author

    McGarrah, D.B. ; Williamson, W., Jr. ; Keeton, S.C.

  • Author_Institution
    Sandia Nat. Lab., Livermore, CA, USA
  • fYear
    1991
  • fDate
    2-9 Nov. 1991
  • Firstpage
    1531
  • Abstract
    A three-dimensional computer simulation of the interaction of various heavy ion cosmic rays with silicon is presented. The initial ion strike is modeled by the classical trajectory Monte Carlo (CTMC) algorithm. Primary electrons produced by the CTMC code, along with their position and momenta, are entered into a nonrelativistic Monte Carlo electron transport program. Both elastic and inelastic scattering events are considered in the simulation of the secondary electron cascade. Inelastic collisions include ionization of all shells. A prediction is made of the quantity and distribution of charge generated within silicon due to the cosmic ray ion strike.<>
  • Keywords
    Monte Carlo methods; cosmic ray effects and interactions; digital simulation; elemental semiconductors; ion beam effects; silicon; 3D computer simulation; Si; all shells ionization; charge distribution; classical trajectory Monte Carlo algorithm; elastic scattering; energetic ion irradiation effect; heavy ion cosmic rays; inelastic collisions; inelastic scattering; initial ion strike; material damage simulation; nonrelativistic Monte Carlo electron transport program; primary electrons; secondary electron cascade; Discrete event simulation; Electrons; Ionization; Ionizing radiation; Monte Carlo methods; Physics; Projectiles; Silicon; Single event upset; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Santa Fe, NM, USA
  • Print_ISBN
    0-7803-0513-2
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1991.259167
  • Filename
    259167