DocumentCode :
3461371
Title :
Use of the in-process bond shear test for predicting gold wire bond failure modes in plastic packages
Author :
Mahaney, Michael ; Shell, Melissa ; Strode, Richard
Author_Institution :
Intel Corp., Chandler, AZ, USA
fYear :
1991
fDate :
9-11 April 1991
Firstpage :
44
Lastpage :
51
Abstract :
A strong relationship is found between in-process (post wirebond) bond shear test results on gold ball bonds and post-process, post-board mount wire pull results. The shear test results detect clear differences in shear strength and failure mode between two types of bond pad structures. Significant variation due to the level of ultrasonic power used in bonding was also found. The subsequent wire pull results obtained from units receiving full package assembly and simulated customer board mount agreed with the in-process shear findings of both pad structure and bonding process effects. The results have promising implications for the use of in-process bond shear as a tool for improving ball bond reliability through wirebond process control and bonding parameter optimization.<>
Keywords :
failure analysis; gold; lead bonding; packaging; reliability; shear strength; Au; ball bond reliability; bond pad structures; bonding parameter optimization; full package assembly; in-process bond shear test; mount wire pull results; plastic packages; shear strength; shear test results; ultrasonic power; wire bond failure modes; Assembly; Bonding forces; Bonding processes; Gold; Inspection; Neck; Plastic packaging; Process control; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1991, 29th Annual Proceedings., International
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-87942-680-2
Type :
conf
DOI :
10.1109/RELPHY.1991.145985
Filename :
145985
Link To Document :
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