DocumentCode :
3461473
Title :
Statistical runtime verification of analog and mixed signal designs
Author :
Wang, Zhiwei ; Zaki, Mohamed H. ; Tahar, Sofiène
Author_Institution :
Dept. ECE, Concordia Univ., Montreal, QC, Canada
fYear :
2009
fDate :
6-8 Nov. 2009
Firstpage :
1
Lastpage :
6
Abstract :
One of the challenges for the verification of analog and mixed signal (AMS) designs is the stochastic behavior associated. In this paper, we propose a runtime verification approach to verify the statistical property of the AMS design. The methodology is based on the combination of the statistical method and Mont Carlo simulation. The verification procedure produces confidence level and error margin that provide the tolerance and accuracy for the verification results. We apply the proposed methodology to study the jitter property of a PLL design.
Keywords :
Monte Carlo methods; integrated circuit design; jitter; mixed analogue-digital integrated circuits; phase locked loops; statistical analysis; stochastic processes; AMS design; Monte Carlo simulation; PLL; analog and mixed signal designs; confidence level; error margin; jitter; statistical runtime verification; stochastic behavior; Circuit simulation; Circuits and systems; Electronics industry; Formal specifications; Monitoring; Runtime; Signal design; Statistical analysis; Stochastic processes; Stochastic resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signals, Circuits and Systems (SCS), 2009 3rd International Conference on
Conference_Location :
Medenine
Print_ISBN :
978-1-4244-4397-0
Electronic_ISBN :
978-1-4244-4398-7
Type :
conf
DOI :
10.1109/ICSCS.2009.5412620
Filename :
5412620
Link To Document :
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