Title :
A new approach to diagnose multiple simultaneous defects
Author :
Ladhar, Aymen ; Izaute, Isabelle ; Masmoudi, Mohamed
Author_Institution :
STMicroelectron., Sfax, Tunisia
Abstract :
This paper presents a new approach for the diagnosis of multiple manufacturing defects that affects digital integrated circuits (IC). The method treats each failing pattern as an independent diagnosis, and finds out the location of potential candidates when they are simultaneously simulated explain each failing pattern. Our methodology consists in three main steps and can diagnose three types of multiple defect configurations. This method can also diagnose multiple faults masked by single fault. Experiments were performed in good ICs in which different types of multiple faults were injected and on devises with real defects. The correct fault locations and cause were predicted in all cases.
Keywords :
crystal defects; fault simulation; integrated circuit modelling; integrated circuit testing; defect detection; digital integrated circuits; failing pattern; independent diagnosis; multiple defect configurations; multiple simultaneous defects; Circuit faults; Dictionaries; Digital integrated circuits; Failure analysis; Fault detection; Fault diagnosis; Manufacturing processes; Partitioning algorithms; Performance analysis; Testing;
Conference_Titel :
Signals, Circuits and Systems (SCS), 2009 3rd International Conference on
Conference_Location :
Medenine
Print_ISBN :
978-1-4244-4397-0
Electronic_ISBN :
978-1-4244-4398-7
DOI :
10.1109/ICSCS.2009.5412621