DocumentCode
346282
Title
Energy-per-cycle estimation at RTL
Author
Gupta, Subodh ; Najm, Farid N.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1999
fDate
17-17 Aug. 1999
Firstpage
121
Lastpage
126
Abstract
We present a novel macromodeling technique for estimating the energy dissipated a logic circuit for every input vector pair (we call this the energy-per-cycle). The macromodel is based on classifying the input vector pairs on the basis of their Hamming distances and using a different equation-based macromodel for every Hamming distance. The variables of our macromodel are zero-delay transition counts at three logic levels inside the circuit. We present an automatic characterization process by which such macromodels can be constructed. This energy-per-cycle macromodel provides a transient energy waveform, and can also be used to estimate the moving average energy over any time window. This approach has been implemented and models have been built and tested for many circuits. The average error observed in estimating the energy-per-cycle is under 20%. The model can also be used to measure the long-term average power, with an observed error of under 10% on average.
Keywords
Boolean functions; combinational circuits; delay estimation; integrated logic circuits; logic CAD; low-power electronics; Hamming distances; RTL; VLSI circuits; automatic characterization process; average error; combinational circuit; energy dissipation; energy-per-cycle estimation; equation-based macromodel; input vector pair; logic circuit; long-term average power; macromodeling technique; moving average energy; register-transfer level; transient energy waveform; zero-delay transition counts; Circuit noise; Circuit testing; Current supplies; Differential equations; Energy consumption; Logic circuits; Power dissipation; Power supplies; Semiconductor device noise; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 1999. Proceedings. 1999 International Symposium on
Conference_Location
San Diego, CA, USA
Print_ISBN
1-58113-133-X
Type
conf
Filename
799426
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