Title :
Degradation Mechanism Of Electron Emission Characteristics In Silicon Field Emitters
Author :
Yoon-Ho Song ; Yong-Min Kim ; Byung Sung O ; Jin Ho Lee ; Kyoung Ik Cho ; Hyung Joun Yoo
Keywords :
Chemical processes; Current measurement; Electron emission; Etching; Fabrication; Field emitter arrays; Thermal degradation; Time measurement;
Conference_Titel :
Information Display, 1997., Proceedings of the Fourth Asian Symposium on
Conference_Location :
Hong Kong, China
Print_ISBN :
962-8273-01-9
DOI :
10.1109/ASID.1997.631439
