Title :
Revised Visual Assessment of (Cluster) Tendency (reVAT)
Author :
Huband, J.M. ; Bezdek, J.C. ; Hathaway, R.J.
Author_Institution :
Dept. of Comput. Sci., Univ. of West Florida, Pensacola, FL, USA
Abstract :
The Visual Assessment of (cluster) Tendency (VAT) method readily displays cluster tendency for small data sets as grayscale images, but is too computationally costly for larger data sets. A revised version of VAT is presented here that can efficiently be applied to larger collections of data. A numerical example is included.
Keywords :
computational complexity; graph theory; pattern clustering; statistical analysis; cluster tendency; computational complexity; graph theory; grayscale images; larger data sets; small data sets; visual assessment; Computer displays; Computer science; Digital images; Equations; Gray-scale; Image generation; Pixel; Roentgenium; Scattering; Tin;
Conference_Titel :
Fuzzy Information, 2004. Processing NAFIPS '04. IEEE Annual Meeting of the
Print_ISBN :
0-7803-8376-1
DOI :
10.1109/NAFIPS.2004.1336257
