Title :
Optical Fault Attacks on AES: A Threat in Violet
Author :
Schmidt, Jörn-Marc ; Hutter, Michael ; Plos, Thomas
Author_Institution :
Inst. for Appl. Inf. Process. & Commun., Graz Univ. of Technol., Graz, Austria
Abstract :
Microprocessors are the heart of the devices we rely on every day. However, their non-volatile memory, which often contains sensitive information, can be manipulated by ultraviolet (UV) irradiation. This paper gives practical results demonstrating that the non-volatile memory can be erased with UV light by investigating the effects of UV-Clight with a wavelength of 254 nm on four different depackaged microcontrollers. We demonstrate that an adversary can use this effect to attack an AES software implementation by manipulating the 256- bit S-box table. We show that if only a single byte of the table is changed, 2 500 pairs of correct and faulty encrypted inputs are sufficient to recover the key with a probability of 90%, in case the key schedule is not modified by the attack. Furthermore, we emphasize this by presenting a practical attack on an AES implementation running on an 8-bit microcontroller. Our attack involves only a standard decapsulation procedure and the use of alow-cost UV lamp.
Keywords :
cryptography; microcontrollers; random-access storage; ultraviolet radiation effects; AES; Advanced Encryption Standard; key schedule; microcontrollers; microprocessors; nonvolatile memory; optical fault attacks; probability; ultraviolet irradiation; Cryptography; Fault diagnosis; Fuses; Heart; Microcontrollers; Microprocessors; Nonvolatile memory; Optical devices; Protection; Security; AES; Fault Analysis; Implementation Attacks; UV-C; Ultraviolet Light;
Conference_Titel :
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2009 Workshop on
Conference_Location :
Lausanne
Print_ISBN :
978-1-4244-4972-9
DOI :
10.1109/FDTC.2009.37