Title :
Mixed-signal circuit testing-A review
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
Testing and fault diagnosis are two important aspects in the design and maintenance of mixed-signal circuits. To enhance testability and fault diagnosability, both design-for-testability (DFT) and built-in self-test (BIST) techniques have been successfully developed for digital circuits. This paper reviews the development of these techniques in analog circuits and discusses the future challenges in both fault diagnosis and testing
Keywords :
automatic testing; built-in self test; design for testability; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; reviews; BIST; DFT; IC testing; built-in self-test; design-for-testability; fault diagnosis; mixed-signal circuit testing; review; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Fault diagnosis; Integrated circuit technology;
Conference_Titel :
Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
Conference_Location :
Rodos
Print_ISBN :
0-7803-3650-X
DOI :
10.1109/ICECS.1996.584604
