• DocumentCode
    346466
  • Title

    Very fast time domain measurement of voltage rising part due to micro gap discharge in air

  • Author

    Kawamata, Ken ; Minegishi, Shigeki ; Haga, Akira ; Sato, Risaburo

  • Author_Institution
    Dept. of Electr. Eng., Hachinohe Inst. of Technol., Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    118
  • Lastpage
    121
  • Abstract
    Voltage rise and fall characteristics due to starting of very short gap discharge were investigated in time domain. The gap space was set very short for voltage below 1500 V as phenomena of CDM ESD and electrical contact of switch devices. The measurement system consists of a distributed constant line system with a coaxial type electrode, because the voltage transients were very rapid. The coaxial electrode has matched impedance for a characteristic impedance of semi-rigid cables of the distributed constant line system. An atmosphere around the coaxial electrode is normal air. This experimental system enables measurement of the high speed and high voltage transients of about 100 ps. As a consequence of the experiment, a relationship between source voltage and voltage rise and fall time were confirmed due to changed source polarity
  • Keywords
    air gaps; electrostatic discharge; time-domain analysis; transient analysis; voltage measurement; CDM ESD; coaxial electrode; coaxial type electrode; distributed constant line system; electrical contact; electromagnetic noise; electrostatic discharge; gap space; matched impedance; micro gap discharge; normal air atmosphere; semi-rigid cables; source polarity change; source voltage; very fast time domain measurement; voltage rise measurement; voltage transients; Atmospheric measurements; Coaxial cables; Coaxial components; Electrodes; Electrostatic discharge; Extraterrestrial phenomena; Impedance; Switches; Time measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    4-9980748-4-9
  • Type

    conf

  • DOI
    10.1109/ELMAGC.1999.801277
  • Filename
    801277