DocumentCode :
3464939
Title :
Automation and evaluation of two different techniques to calibrate precision calibrators for LF voltage & current using thermal devices
Author :
Pal, Bijendra ; Ahmad, Saood ; Govil, A.K. ; Banerjee, P.
Author_Institution :
Nat. Phys. Lab., C.S.I.R., New Delhi, India
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
171
Lastpage :
172
Abstract :
Low Frequency (LF) voltage and current are important parameters in Electrical Metrology. The standards for LF voltage and current are established by assigning AC-DC transfer difference to thermal devices i.e. thermal converter (TC) or thermal transfer standard (TTS) alongwith current shunts. Automated calibration systems have been developed using Null and Budovsky´s techniques for calibration of precision calibrator for LF voltage and current using thermal devices (TC/TTS) alongwith current shunts. The technique based on the Algorithm developed by Dr. Ilya Budovsky (N.M.I. Australia) has been compared with the conventional null technique. The softwares have been used to calibrate the calibrator in the entire LF voltage and current range using Holt converters and current shunts. Calibration results at 1V and 10V level in the frequency range from 10Hz to 1MHz are presented in this paper. The results show that the Budovsky´s technique has reduced the complexity of AC-DC transfer measurements, measurement time and the uncertainty in measurement at some points.
Keywords :
calibration; electric variables measurement; measurement systems; AC-DC transfer difference; Budovsky technique; Holt converters; alongwith current shunts; automated calibration systems; complexity reduction; electrical metrology; frequency 1 MHz; frequency 10 Hz; low frequency voltage; measurement time; precision calibrators; thermal converter; thermal devices; thermal transfer standard; voltage 1 V; voltage 10 V; Analog-digital conversion; Australia; Automation; Calibration; Frequency; Low voltage; Measurement uncertainty; Metrology; Speech synthesis; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5543595
Filename :
5543595
Link To Document :
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