• DocumentCode
    3465069
  • Title

    A High-Density 45nm SRAM Using Small-Signal Non-Strobed Regenerative Sensing

  • Author

    Verma, Naveen ; Chandrakasan, Anantha P.

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge, MA
  • fYear
    2008
  • fDate
    3-7 Feb. 2008
  • Firstpage
    380
  • Lastpage
    621
  • Abstract
    In this work, an SRAM in low-power 45nm CMOS is composed of 0.25mum2 bit-cells and uses an offset-compensating non-strobed regenerative sense-amplifier (NSR-SA); this eliminates the need to insert timing margin for variation and tracking errors in the strobe signal, and it achieves higher sensitivity than conventional SAs, allowing read SNM to be optimized at the cost of IREAD. The NSR-SA uses nearly minimum-sized inverters, so its delay and area scaling follow logic trends more closely than conventional SAs.
  • Keywords
    CMOS memory circuits; SRAM chips; amplifiers; invertors; low-power electronics; area scaling; bit-cells; error tracking; high-density SRAM; low-power CMOS; offset-compensation; size 45 nm; small-signal nonstrobed regenerative sensing; strobe signal; CMOS technology; Circuit noise; Inverters; Negative feedback; Random access memory; Switches; Timing; Transfer functions; Very large scale integration; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-2010-0
  • Electronic_ISBN
    978-1-4244-2011-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2008.4523216
  • Filename
    4523216