Title :
A systems framework for transmitting information between design and test
Author :
Rhyne, Richard T. ; Barton, David L. ; Bukata, Eric
Abstract :
In spite of good intentions, and the work of many people over many years, test engineers and design engineers are still divided by a great chasm. Design information is still thrown "over the wall" to test, and information from test is seldom reflected back in design. The authors present a systems framework that allows models to be used as design rule specifications in the design process, used as test requirements in the test process, and modified by measurement data from the production floor
Keywords :
application specific integrated circuits; automatic testing; design for testability; integrated circuit design; integrated circuit modelling; integrated circuit testing; production testing; Rosetta models; derating models; design process; design rule checkers; design rules specifications; production floor; systems framework; systems on chip design; test requirements; Design engineering; Equations; Frequency measurement; Heart; Process design; Production systems; Silicon; System testing; Time measurement; Voltage;
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
Print_ISBN :
0-7803-7094-5
DOI :
10.1109/AUTEST.2001.948919
