Title :
Enhancement of microwave plasma characteristics for biomedical applications using pulse modulation method
Author :
Lee, H.W. ; Kang, Sung Kil ; Kwon, S.K. ; Won, Im Hee ; Kwon, H.C. ; Kim, Hyung Yoon ; Lee, Jung Keun ; Lee, H.W.
Author_Institution :
Pohang Univ. of Sci. & Technol., Pohang, South Korea
Abstract :
Pulse modulation technique was applied for microwave excited atmospheric pressure air and Ar plasmas with fixed average power. Breakdown and sustain powers were measured and UV-Vis emission spectra were observed. As the duty ratio decreased, pulse modulated plasmas showed enhanced results as compared to continuous signal excited plasmas. Breakdown powers of both of air and Ar plasmas were reduced as duty ratio decreased. Reactive species including hydroxyl radicals, atomic oxygen and nitric oxide were increased with the decrease of duty ratio. The change of breakdown power and increase of reactive species give advantages for biomedical applications. Gas temperature was reduced also in both of air and Ar plasmas with the decrease of duty ratio. The results related to the high energy electrons which were generated during on-time of the microwave signal. Blood coagulation experiment of the air plasma was conducted and it showed ~7 times faster coagulation than natural coagulation.
Keywords :
argon; blood; high-frequency discharges; plasma diagnostics; plasma temperature; Ar; UV-visible emission spectra; atomic oxygen; biomedical application; blood coagulation experiment; breakdown power; continuous signal excited plasmas; discharge; fixed average power; gas temperature; high energy electron; hydroxyl radicals; microwave excited atmospheric pressure air plasmas; microwave excited atmospheric pressure argon plasmas; microwave plasma characteristics; natural coagulation; nitric oxide; pressure 1 atm; pulse modulated plasmas; pulse modulation method; reactive species; Coagulation; Electric breakdown; Microwave theory and techniques; Plasma temperature; Temperature;
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
DOI :
10.1109/PPC.2013.6627448