Title :
Laser-triggering of spark gap switches
Author :
Larsson, A. ; Yap, Danny ; Au, Jason ; Carlsson, Torgny E.
Author_Institution :
Temasek Labs., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
Switching time jitter is one of the important properties to consider when selecting a closing switch for a pulsed-power system, and the most time-precise triggering can be achieved by the use of lasers. For a mid-gap laser-triggered spark gap, three different physical mechanisms can be used: nonresonant multiphoton ionization, resonant-enhanced multiphoton ionization and electron tunneling. The first one is tradition all y used, whereas the latter two are more exploratory. In this work, the traditional method is employed to study the delay time and time jitter of a laser-triggered spark gap using a Nd:YAG laser at 1064 nm and 532 nm, where the laser pulse is guided via an optical fibre to the spark gap; the laser pulse energy and the applied voltage have been varied for different working gases. One draw-back of the current laser triggering technology compared to other triggering techniques is that laser systems are more complex and prone to electromagnetic interference. Another downside is that the pulse-repetition rate is poor. A discussion about the development of lasers to overcome these issues is included, together with a deliberation about the pros and cons of the two exploratory methods of laser triggering.
Keywords :
electromagnetic interference; fibre lasers; ionisation; jitter; optical fibres; spark gaps; switches; YAG:Nd; electromagnetic interference; electron tunneling; laser pulse; laser pulse energy; laser triggering technology; laser-triggered spark gap; nonresonant multiphoton ionization; pulse-repetition rate; pulsed-power system; spark gap switches; switching time jitter; time-precise triggering; triggering techniques; wavelength 1064 nm; wavelength 532 nm; Fiber lasers; Free electron lasers; Gas lasers; Ionization; Jitter; Laser theory; Sparks;
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
DOI :
10.1109/PPC.2013.6627479