• DocumentCode
    3466950
  • Title

    Plasma Treatment on the Plastic Substrates for Liquid Phase Deposited SiO2 Films for Flexible Electronics Applications

  • Author

    Lin, Yu-Ju ; Yeh, Chih-Chieh ; Huang, Li-Ming ; Ten-Chin Wen ; Wang, Yeong-Her

  • Author_Institution
    Dept. of Electr. Eng., National Cheng-Kung Univ., Tainan
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    893
  • Lastpage
    895
  • Abstract
    Liquid phase deposition (LPD) method to grow the silicon dioxide interlayer on the PES plastic substrates with the O2/Ar plasma pre-treatment is investigated. After which, the interlayer on the plastic substrates is grown and the films´ quality on the substrates with or without the plasma pre-treatment is examined by using scanning electron microscopy, etching rate of the oxide layer by the diluted HF solution and surface leakage current measurement. The pentacene-based organic thin film transistors on the dielectric layers suitable for flexible electronics applications are demonstrated
  • Keywords
    electric current measurement; etching; flexible electronics; leakage currents; liquid phase deposited coatings; organic compounds; plasma materials processing; scanning electron microscopy; silicon compounds; thin film transistors; PES plastic substrates; SiO2; dielectric layers; diluted HF solution; etching rate; flexible electronics; liquid phase deposited films; liquid phase deposition; oxide layer; pentacene-based organic thin film transistors; plasma pre-treatment; plasma treatment; scanning electron microscopy; silicon dioxide interlayer; surface leakage current measurement; Argon; Dielectric substrates; Etching; Flexible electronics; Hafnium; Plasma applications; Plasma measurements; Plastic films; Scanning electron microscopy; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306563
  • Filename
    4098268