DocumentCode :
3467508
Title :
Electromagnetic and chromatic analyses of plasma in transient state
Author :
Dong-Hun Kim ; Hyun-Jung Kim ; Park, Bong-Ryeol ; Yong-Dea Kang ; Junsung Kim ; Jungwon Kang ; Jeongsoo Lee
Author_Institution :
Mater. & Components R&D Lab., LG Electron., Seoul, South Korea
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
PLS (Plasma Lighting System) is one of the discharge lamps that have electrodeless bulb. Simply, there are three states of materials which are initial, transient, and saturation during the lamp operation. In these states, transient state is very difficult to understand its physical phenomenon. Because a magnetron which is an electrical active source and plasma which is an electrical active load are not stabilized, electric and chromatic characteristics of plasma are changed simultaneously. In that reason, we conduct the experiment and the simulation to acquire a trajectory of plasma load in Rieke diagram, a variation of main frequency of a magnetron with varying an electric conductivity of plasma in the electromagnetic simulation, and CCT calculated from emission spectrum of plasma. Using electromagnetic and chromatic analyses, characteristic of plasma in transient state can be estimated.
Keywords :
electrical conductivity; magnetrons; plasma diagnostics; plasma simulation; plasma transport processes; Rieke diagram; discharge lamp; electrical active source; electrodeless bulb; magnetron frequency variation; material state; physical phenomenon; plasma chromatic characteristic analysis; plasma electric characteristic analysis; plasma electric conductivity variation; plasma electromagnetic analysis; plasma electromagnetic simulation; plasma emission spectrum calculation; plasma lighting system; plasma load trajectory acquisition; transient state; Electromagnetic waveguides; Impedance; Magnetic flux; Plasmas; Saturation magnetization; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
ISSN :
2158-4915
Type :
conf
DOI :
10.1109/PPC.2013.6627516
Filename :
6627516
Link To Document :
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