DocumentCode
3468804
Title
A Time Dependent Dielectric Breakdown(TDDB) Prognostic Monitor
Author
Lv, Yu-Bing ; Zhuang, Yiqi ; Li, XiaoMing ; Bai, Hao ; Wang, DangHui
Author_Institution
Dept. of Microelectron., Xidian Univ., Xi´´an
fYear
2006
fDate
23-26 Oct. 2006
Firstpage
1174
Lastpage
1176
Abstract
A TDDB monitoring circuit structure for an on-chip end-of-life indicators disclosed here, which can be integrated and degraded with the device, and give an alarm when the device needs replacing. This is estimated down time of the system where this IC is used and this circuit structure only needs a very small area
Keywords
electric breakdown; indicators; integrated circuit testing; integrated circuit structure; monitoring circuit structure; on-chip end-of-life indicators; prognostic monitor; time dependent dielectric breakdown; Acceleration; Capacitors; Circuits; Condition monitoring; Dielectrics; Electric breakdown; Microelectronics; Stress; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0160-7
Electronic_ISBN
1-4244-0161-5
Type
conf
DOI
10.1109/ICSICT.2006.306067
Filename
4098358
Link To Document