Title :
Iterative built-in testing and tuning of mixed-signal/RF systems
Author :
Chatterjee, A. ; Han, D. ; Natarajan, V. ; Devarakond, S. ; Sen, S. ; Choi, H. ; Senguttuvan, R. ; Bhattacharya, S. ; Goyal, A. ; Lee, D. ; Swaminathan, M.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Design and test of high-speed mixed-signal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, post-manufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune procedures. Such procedures create new challenges for manufacturing test and built-in self-test of advanced mixed-signal/RF systems. In this paper, key test challenges are discussed and promising solutions are presented in the hope that it will be possible to design, manufacture and test ¿truly self-healing¿ systems in the near future.
Keywords :
CMOS integrated circuits; built-in self test; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; high-speed electronic circuits; high-speed mixed-signal-RF circuits; iterative built-in testing; iterative test-and-tune procedures; post-manufacture tuning; scaled CMOS technologies; truly self-healing systems; Automatic testing; CMOS process; CMOS technology; Circuit optimization; Circuit testing; Circuits and systems; Electronic equipment testing; High-speed electronics; Radio frequency; System testing;
Conference_Titel :
Computer Design, 2009. ICCD 2009. IEEE International Conference on
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
978-1-4244-5029-9
Electronic_ISBN :
1063-6404
DOI :
10.1109/ICCD.2009.5413136
