• DocumentCode
    3469815
  • Title

    Likelihood adjustment: a simple method for better forecasting from small samples

  • Author

    Fulton, J.W. ; Abernethy, Robert B.

  • Author_Institution
    Fulton Findings, Torrance, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    150
  • Lastpage
    154
  • Abstract
    New methods developed by the authors improve data analysis and reliability prediction accuracy when using maximum likelihood estimates (MLE) particularly for small samples. The Fulton factor (FF) modifies the likelihood ratio test to reduce nonconservative bias when measuring difference between designs. The reduced bias adjustment (RBA) factor decreases bias in distribution parameter estimates for better reliability and lifetime predictions. Finally, a postulated relationship designated the justified likelihood function (JLF) reduces confidence contour bias for better confidence interval estimates and for use in graphical comparison of design alternatives. Monte Carlo simulation provides the basis for these conclusions. The results herein apply to complete samples, but also work well with suspensions using failure quantity only as the sample size. Additional research into data with suspensions is desirable
  • Keywords
    Monte Carlo methods; failure analysis; maximum likelihood estimation; reliability theory; Fulton factor; Monte Carlo simulation; confidence contour bias; confidence interval estimates; data analysis; distribution parameter estimates; justified likelihood function; lifetime predictions; likelihood adjustment; maximum likelihood estimates; nonconservative bias; reduced bias adjustment factor; reliability; reliability forecasting; reliability prediction accuracy; small samples; Data analysis; Gaussian distribution; Inverse problems; Maximum likelihood estimation; Parameter estimation; Probability; Reliability engineering; Suspensions; Testing; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2000. Proceedings. Annual
  • Conference_Location
    Los Angeles, CA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-5848-1
  • Type

    conf

  • DOI
    10.1109/RAMS.2000.816299
  • Filename
    816299