Development of a burn-in time reduction algorithm using the principles of acceleration factors

To have fast EPROM manufacturing turnaround time and be cost-effective in a highly competitive market, a reduction in burn-in time is highly desirable. The author addresses this manufacturing issue. By using the principles of temperature and electric field acceleration factors and taking into consideration the prevailing device and burn-in equipment limitations, a new and simple algorithm for reducing the burn-in time has been developed. Experiments were performed on different nonvolatile memory products of various fabrication process technologies to prove the efficacy and manufacturability of this application.<>