DocumentCode
3469874
Title
A 1.2 V BiCMOS class AB log-domain filter
Author
Punzenberger, M. ; Enz, C.
Author_Institution
Swiss Federal Inst. of Technol., Lausanne, Switzerland
fYear
1997
fDate
8-8 Feb. 1997
Firstpage
56
Lastpage
57
Abstract
Companding improves dynamic range in situations with restricted signal swing, such as in low-voltage circuits, without the need to reduce noise at the cost of increased power dissipation. The log-domain filter principle achieves instantaneous signal companding by taking advantage of exponential device characteristics. Thanks to the high compression ratio, voltage swing and frequency tuning become almost independent of supply voltage, which can be reduced to the minimum required for proper operation. The combination of instantaneous companding with class AB operation permits processing of signals much larger than the bias level and hence increases dynamic range substantially. Class AB log-domain filters are suited to low-voltage and low power applications with moderate signal-to-noise ratio (SNR) and linearity requirements. The authors present a 3/sup rd/-order Chebyshev filter which is based on an integrator and implemented in a 1 /spl mu/m BiCMOS process. The filter can be tuned over more than 3 decades with cut-off frequencies ranging from 10 kHz to 15 MHz at supply voltages between 0.9 V and 2 V. For a 1.2 V supply, cut-off frequencies up to about 1 MHz are achieved.
Keywords
BiCMOS analogue integrated circuits; Chebyshev filters; active filters; circuit tuning; integrating circuits; 0.9 to 2 V; 1 micron; 10 kHz to 15 MHz; 52.5 dB; BiCMOS process; class AB operation; companding; dynamic range; integrator based design; log-domain filter; low power applications; low-voltage applications; third-order Chebyshev filter; BiCMOS integrated circuits; Circuit noise; Circuit optimization; Costs; Cutoff frequency; Dynamic range; Filters; Noise reduction; Power dissipation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-3721-2
Type
conf
DOI
10.1109/ISSCC.1997.585259
Filename
585259
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