• DocumentCode
    3469878
  • Title

    Development of 0.5 mm thick small outline packages

  • Author

    Song, Young-Jac ; Ahn, Seung-ho ; Oh, Se-Yong

  • Author_Institution
    Package Dev., Samsung Semicond., Kiheng, South Korea
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    304
  • Lastpage
    309
  • Abstract
    Two types of 0.5 mm thick UTSOP´s (Ultra Thin Small Outline Packages) were developed, a conventional type with die pad, and a LOC(Lead on Chip) type. In both types, the die pad or the backside of the chip is exposed to the bottom of the package. In order to accomplish 0.5 mm thickness of the package, high strength alloy lead frames with 100 μm thickness, and low-loop wire-bonding technology were used. The chip thicknesses in the conventional type, and the LOC type were 200 μm and 300 μm, respectively. Because, from the package structural point of view, the top half and the bottom half of the packages were unbalanced in terms of thermal expansion coefficients, the warpage of the packages was an expected problem. However, the warpage was reduced below 40 μm by the material changes and the modification of lead frame design. Various molding compounds with different characteristics, and two kinds of lead frame materials were tried. Package reliability of the UTSOP´s were evaluated
  • Keywords
    integrated circuit packaging; integrated circuit reliability; lead bonding; thermal expansion; 0.5 mm; 100 to 300 micron; UTSOP; alloy lead frames; chip thicknesses; die pad; lead frame design; lead on chip type; low-loop wire-bonding technology; package reliability; thermal expansion coefficients; ultra thin small outline packages; Assembly; Conductors; Electronic equipment testing; Electronics packaging; Lab-on-a-chip; Lead; Material storage; Packaging; Plastic packaging; Semiconductor device packaging; Silicon; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-2996-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.526179
  • Filename
    526179