Title :
A novel structure to realize crack-free plastic package during reflow soldering process-development of CSS (chip side support) package
Author :
Nakazawa, Tsutomu ; Unoue, Y. ; Sawada, Kanako ; Sudo, Toshio
Author_Institution :
Semicond. Device Eng. Lab., Toshiba Corp., Kawasaki, Japan
Abstract :
Reports a novel structure of a plastic package without a die-pad whereby adhesion strength is improved and thermal stress reduced. The non-die-pad structure has been realized by the chip side support (CSS) method. Furthermore, this paper describes the derivation of an equation that can be used as a criterion for judging package cracking or delamination by comparing the shear strength with the shear stress. The equation for shear stress can be estimated by the finite element method
Keywords :
adhesion; delamination; finite element analysis; integrated circuit packaging; plastic packaging; reflow soldering; thermal stresses; adhesion strength; chip side support package; crack-free plastic package; delamination; finite element method; package cracking; reflow soldering process-development; shear strength; shear stress; thermal stress; Adhesives; Cascading style sheets; Delamination; Equations; Finite element methods; Lead; Moisture; Plastic packaging; Reflow soldering; Resins; Semiconductor device packaging; Thermal stresses; Wire;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
DOI :
10.1109/IEMT.1995.526180