• DocumentCode
    3470155
  • Title

    Analysis of the factors to affect technology transfer fee in the intellectual property management

  • Author

    Jungwook, Byun ; Yunbae, Kim ; Byungchul, Lee ; Bodum, Choi ; Chanmin, Park

  • Author_Institution
    Manage. of Technol. Dept., Sungkyunkwan Univ., Suwon, South Korea
  • fYear
    2009
  • fDate
    2-6 Aug. 2009
  • Firstpage
    2821
  • Lastpage
    2833
  • Abstract
    In knowledge-based global economy, securing technologies through investment for technology innovation is essential in order to gain more sustainable competitive advantage. R&D activities required for such purpose may be recognized when they can result in economic value ultimately. This study focuses on the revenue from technology transfer as an achievement of national R&D projects and develops an intellectual property management index to measure such revenue. In this regard, not only intellectual property management activities at laboratory level but also the characteristics of Subject as well as supports from research institutes have important role in improvement of investment efficiency of national R&D projects.
  • Keywords
    economics; industrial property; innovation management; investment; security; technology transfer; economic value; intellectual property management index; investment efficiency; knowledge-based global economy; national R&D projects; revenue measurement; technology innovation; technology security; technology transfer fee; Environmental economics; Intellectual property; Investments; Laboratories; Project management; Research and development; Research and development management; Technological innovation; Technology management; Technology transfer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Engineering & Technology, 2009. PICMET 2009. Portland International Conference on
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-890843-20-5
  • Electronic_ISBN
    978-1-890843-20-5
  • Type

    conf

  • DOI
    10.1109/PICMET.2009.5261805
  • Filename
    5261805