• DocumentCode
    3470187
  • Title

    Multi-state k-out-of-n system model and its applications

  • Author

    Huang, Jinsheng ; Zuo, Ming J.

  • Author_Institution
    Alberta Univ., Edmonton, Alta., Canada
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    264
  • Lastpage
    268
  • Abstract
    The binary k-out-of-n system is a commonly used reliability model in engineering practice. Many authors have extended the concept of binary k-out-of-n system to multi-state k-out-of-n systems, but with a limitation that k is assumed to be a constant at all the system levels. In this paper, a new definition of the multi-state k-out-of-n system is presented. Under the proposed definition, maintaining at least a certain system state level may require a different number of components to be at a certain state or above. The multi-state k-out-of-n system model has more complex properties than binary k-out-of-n systems. Increasing and decreasing multi-state k-out-of-n systems are two special types of the multi-state k-out-of-n system. The increasing multi-state k-out-of-n system has the dominant property, and as a result, we can treat it as a binary k-out-of-n system for each fixed required system state level. The decreasing multi-state k-out-of-n system does not belong to the dominant multi-state system group, and consequently, we can not extend all results from the binary k-out-of-n system to it. Examples are given to illustrate that the multi-state k-out-of-n system model can be used to describe various engineering systems
  • Keywords
    consecutive system reliability; engineering; failure analysis; engineering practice; multi-state k-out-of-n system model; reliability model; system state level; Reliability engineering; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2000. Proceedings. Annual
  • Conference_Location
    Los Angeles, CA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-5848-1
  • Type

    conf

  • DOI
    10.1109/RAMS.2000.816319
  • Filename
    816319