DocumentCode :
3470490
Title :
Learning to enhance reliability of electronic systems through effective modeling and risk assessment
Author :
Walls, Lesley ; Quigley, John
Author_Institution :
Strathclyde Univ., Glasgow, UK
fYear :
2000
fDate :
2000
Firstpage :
358
Lastpage :
363
Abstract :
Now that electronic components have demonstrated high reliability, attention has centered upon enhancing the reliability of electronic systems. We introduce a modeling framework to support decision-making during electronic systems design with a view to enhancing operational reliability. We differentiate our work from those models that seek only to provide reliability predictions. Our premise is that modeling can be used to give a better understanding of the impact of engineering decisions on those factors affecting reliability. Through modeling, the decision-maker is encouraged to reflect upon the consequences of actions to learn how a design might be enhanced. The model formulation and data management processes are described for an assumed evolutionary design process. Bayesian approaches are used to combine data types and sources. Exploratory data analysis identifies those factors affecting operational reliability. Expert knowledge is elicited to assess how these factors might impact upon proposed designs. Statistical inference procedures are used to support an assessment of risks associated with design decisions. Applications to the design of electronic systems for aircraft illustrate the usefulness of the model. On-going research is being conducted to fully evaluate the proposed approach
Keywords :
Bayes methods; avionics; reliability; risk management; Bayesian approaches; aircraft electronic equipment; data management processes; decision-maker; electronic systems; engineering decisions; event data analysis; evolutionary design process; expert knowledge; exploratory data analysis; model formulation; modeling; operational reliability; reliability enhancement; risk assessment; statistical inference procedures; statistical model; Aerospace electronics; Aerospace industry; Aircraft; Bayesian methods; Data analysis; Electronic equipment; Prediction methods; Process design; Reliability engineering; Risk management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2000. Proceedings. Annual
Conference_Location :
Los Angeles, CA
ISSN :
0149-144X
Print_ISBN :
0-7803-5848-1
Type :
conf
DOI :
10.1109/RAMS.2000.816334
Filename :
816334
Link To Document :
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