DocumentCode :
3471047
Title :
A two-path bandpass /spl Sigma//spl Delta/ modulator for digital IF extraction at 20 MHz
Author :
Ong, A.K. ; Wooley, B.A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fYear :
1997
fDate :
8-8 Feb. 1997
Firstpage :
212
Lastpage :
213
Abstract :
There is expanding interest in the possibility of moving the intermediate frequency (IF) signal processing in radio receivers and radio test equipment from the analog domain into the digital domain. Digitization of IF processing confers several important advantages, including greater reliability, potentially lower power consumption, and improved performance as technology scales. Unfortunately, as analog signal processing is eliminated and the A/D conversion is moved away from baseband, the signal that must be digitized has a larger dynamic range, and the converter must operate at a higher sampling rate. This work introduces a two-path, switched-capacitor architecture for a bandpass /spl Sigma//spl Delta/ modulator that is suited to digitizing narrowband radio signals with large dynamic range. A fourth-order bandpass modulator is implemented in a standard 0.6 /spl mu/m, single-poly, triple-metal CMOS process. Operating from a single 3.3 V supply, the modulator digitizes a 200 kHz signal centered at an IF of 20 MHz with an extrapolated dynamic range of 75 dB.
Keywords :
CMOS integrated circuits; digital radio; modulators; radio receivers; sigma-delta modulation; switched capacitor networks; 0.6 micron; 20 MHz; 200 kHz; 3.3 V; A/D conversion; IF signal processing; digital IF extraction; double loop; dynamic range; fourth-order type; intermediate frequency signal processing; narrowband radio signals; radio receivers; radio test equipment; sampling rate; single-poly triple-metal CMOS process; switched-capacitor architecture; two-path bandpass /spl Sigma//spl Delta/ modulator; Baseband; Digital modulation; Digital signal processing; Dynamic range; Energy consumption; Frequency; Receivers; Signal processing; Signal sampling; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International
Conference_Location :
San Francisco, CA, USA
ISSN :
0193-6530
Print_ISBN :
0-7803-3721-2
Type :
conf
DOI :
10.1109/ISSCC.1997.585337
Filename :
585337
Link To Document :
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