DocumentCode :
3472695
Title :
In-depth evaluation of horizontal genomics R&D programs in Korea
Author :
Yoo, Seung Jun ; Kim, Sungjin ; Kil, Boojong
Author_Institution :
R&D Evaluation Center, KISTEP, Seoul, South Korea
fYear :
2009
fDate :
2-6 Aug. 2009
Firstpage :
1542
Lastpage :
1554
Abstract :
In the present study, we performed in-depth evaluation of the horizontal genomics R&D programs carried out by 5 ministries (MEST, MW, MLTM, RDA, KFDA) as a way of R&D program (or technology) management. In the evaluation, we focused on three evaluation aspects which are 1) relevance, 2) efficiency (or cost-effectiveness), 3) success (or goal-achievement) after designing logic model which was complemented with cause and effect map using system dynamics concept to show better relationship between R&D activity and its performance/impact. First, we evaluated relevance issue as follows; investment portfolio analysis by 2 times 2 matrix based on market uncertainty, technology risk (or difficulty), technology level, commercialization possibility, etc. Second, we evaluated efficiency issue as follows; quantitative analysis of SCI papers and patents derived from public R&D investment and qualitative analyses of SCI paper using impact factor (IF) and citation index and of patents using citation index and patent value assessment. Lastly, we evaluated success issue by addressing achievement of final goal of each R&D programs and by suggesting a guide to achieve the goals. Taken together, we suggested the efficient program delivery alternatives and guideline to budget allocation, according to the long-term aspects of genomics R&D and current status of R&D capability.
Keywords :
genomics; patents; research and development; risk analysis; R&D programs; citation index; commercialization possibility; horizontal genomics; impact factor; in-depth evaluation; market uncertainty; matrix; patent value assessment; technology risk; Bioinformatics; Citation analysis; Genomics; Investments; Logic design; Performance evaluation; Portfolios; Risk analysis; Technology management; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Engineering & Technology, 2009. PICMET 2009. Portland International Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-890843-20-5
Electronic_ISBN :
978-1-890843-20-5
Type :
conf
DOI :
10.1109/PICMET.2009.5261986
Filename :
5261986
Link To Document :
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