• DocumentCode
    3473975
  • Title

    Open architecture test system: not why but when!

  • Author

    Chakradhar, Srimat

  • Author_Institution
    NEC Laboratories America
  • fYear
    2004
  • fDate
    27-30 Jan. 2004
  • Firstpage
    337
  • Lastpage
    340
  • Keywords
    Automatic testing; Chip scale packaging; Consumer electronics; Costs; Electronic equipment manufacture; Electronic equipment testing; Fabrication; Manufacturing; Semiconductor device manufacture; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
  • Print_ISBN
    0-7803-8175-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2004.1337594
  • Filename
    1337594
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3473975