DocumentCode :
3474019
Title :
"Signal integrity analysis in the open architecture"
Author :
Petrich, D.M.
Author_Institution :
Wavecrest Corporation
fYear :
2004
fDate :
27-30 Jan. 2004
Firstpage :
342
Lastpage :
342
Abstract :
Wavecrest is proud to be a charter member of the Semiconductor Test Consortium. For the last 8 years Wavecrest has played a leadership roll in signal integrity analysis with various standards [4] groups. This expertise has head us to develop IP useful in the analysis of fast data signals.
Keywords :
Bandwidth; Bit error rate; Data analysis; Hardware; Phase locked loops; Production; Sampling methods; Signal analysis; System testing; Timing jitter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
Type :
conf
DOI :
10.1109/ASPDAC.2004.1337596
Filename :
1337596
Link To Document :
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