Title :
"Signal integrity analysis in the open architecture"
Author_Institution :
Wavecrest Corporation
Abstract :
Wavecrest is proud to be a charter member of the Semiconductor Test Consortium. For the last 8 years Wavecrest has played a leadership roll in signal integrity analysis with various standards [4] groups. This expertise has head us to develop IP useful in the analysis of fast data signals.
Keywords :
Bandwidth; Bit error rate; Data analysis; Hardware; Phase locked loops; Production; Sampling methods; Signal analysis; System testing; Timing jitter;
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
DOI :
10.1109/ASPDAC.2004.1337596