DocumentCode
3474045
Title
Opportunities with the open architecture test system
Author
Tada, T.
Author_Institution
Tokushima Bunri University
fYear
2004
fDate
27-30 Jan. 2004
Firstpage
343
Lastpage
348
Abstract
The capital cost of ATE has been increasing over the past decade because of many number of new ATE platforms. It is required that fewer kind of ATE platforms will be produced form `ATE vendors. ATE/ Test industry have been expecting the proposal of the industrial standard specification of ATE System which could drastically reduce the ATE cost at both of vendor and user.
Keywords
Analytical models; Circuit testing; Cities and towns; Costs; Hardware; Large scale integration; Productivity; Semiconductor device testing; Synthesizers; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location
Yohohama, Japan
Print_ISBN
0-7803-8175-0
Type
conf
DOI
10.1109/ASPDAC.2004.1337597
Filename
1337597
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