Title :
Opportunities with the open architecture test system
Author_Institution :
Tokushima Bunri University
Abstract :
The capital cost of ATE has been increasing over the past decade because of many number of new ATE platforms. It is required that fewer kind of ATE platforms will be produced form `ATE vendors. ATE/ Test industry have been expecting the proposal of the industrial standard specification of ATE System which could drastically reduce the ATE cost at both of vendor and user.
Keywords :
Analytical models; Circuit testing; Cities and towns; Costs; Hardware; Large scale integration; Productivity; Semiconductor device testing; Synthesizers; System testing;
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
DOI :
10.1109/ASPDAC.2004.1337597