• DocumentCode
    3474045
  • Title

    Opportunities with the open architecture test system

  • Author

    Tada, T.

  • Author_Institution
    Tokushima Bunri University
  • fYear
    2004
  • fDate
    27-30 Jan. 2004
  • Firstpage
    343
  • Lastpage
    348
  • Abstract
    The capital cost of ATE has been increasing over the past decade because of many number of new ATE platforms. It is required that fewer kind of ATE platforms will be produced form `ATE vendors. ATE/ Test industry have been expecting the proposal of the industrial standard specification of ATE System which could drastically reduce the ATE cost at both of vendor and user.
  • Keywords
    Analytical models; Circuit testing; Cities and towns; Costs; Hardware; Large scale integration; Productivity; Semiconductor device testing; Synthesizers; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
  • Conference_Location
    Yohohama, Japan
  • Print_ISBN
    0-7803-8175-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2004.1337597
  • Filename
    1337597