DocumentCode :
3474045
Title :
Opportunities with the open architecture test system
Author :
Tada, T.
Author_Institution :
Tokushima Bunri University
fYear :
2004
fDate :
27-30 Jan. 2004
Firstpage :
343
Lastpage :
348
Abstract :
The capital cost of ATE has been increasing over the past decade because of many number of new ATE platforms. It is required that fewer kind of ATE platforms will be produced form `ATE vendors. ATE/ Test industry have been expecting the proposal of the industrial standard specification of ATE System which could drastically reduce the ATE cost at both of vendor and user.
Keywords :
Analytical models; Circuit testing; Cities and towns; Costs; Hardware; Large scale integration; Productivity; Semiconductor device testing; Synthesizers; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
Type :
conf
DOI :
10.1109/ASPDAC.2004.1337597
Filename :
1337597
Link To Document :
بازگشت