Title :
An Improved Heuristic Algorithm for MCM Substrate Test
Author :
Dong, Gang ; Xu, Ru-Qing ; Huang, Wei-Wei ; Yang, Yin-tang
Author_Institution :
Inst. of Microelectron., Xidian Univ.
Abstract :
An improved heuristic algorithm for finding the optimal traversal route of a single probe to test MCM interconnects is presented in this paper. Heuristic algorithm is firstly used to get an initial result for the optimization problem, and then simulated annealing algorithm is used to improve the result dramatically. Simulation shows that the new novel heuristic algorithm is effective to solve single probe routing optimization problem
Keywords :
integrated circuit interconnections; integrated circuit testing; multichip modules; network routing; simulated annealing; MCM interconnects; heuristic algorithm; multichip modules; optimal traversal route; routing optimization; simulated annealing; Costs; Equations; Heuristic algorithms; Materials testing; Probes; Routing; Semiconductor device packaging; Semiconductor device testing; Simulated annealing; Substrates;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306669
