DocumentCode :
3474924
Title :
Principal line based ICP alignment for palmprint verification
Author :
Li, Wei ; Zhang, Lei ; Zhang, David ; Yan, Jingqi
Author_Institution :
Inst. of Image Process. & Pattern Recognition, Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
1961
Lastpage :
1964
Abstract :
Image alignment is a crucial step in palmprint verification. However, most of the existing palmprint alignment methods use only some key points between fingers or in palm boundary to extract the region of interest (ROI), which is consequently used for feature extraction and matching. Such alignment methods can only give a coarse alignment of the palmprint images. This paper presents a new effective refinement method for palmprint alignment by adapting the iterative closest point (ICP) method to the palmprint principal lines. The proposed method offers a more accurate alignment of palmprints by correcting efficiently the shifting, rotation and scaling variations introduced in data acquisition. The experimental results show that the proposed method can greatly improve the palmprint verification accuracy in real time.
Keywords :
biometrics (access control); feature extraction; image matching; iterative methods; ICP; data acquisition; feature extraction; feature matching; iterative closest point method; palm boundary; palmprint image alignment; palmprint principal lines; palmprint verification; region of interest; Authentication; Biometrics; Data mining; Feature extraction; Fingers; Image processing; Iterative closest point algorithm; Iterative methods; Pattern recognition; Shape; ICP; Palmprint recognition; biometrics; image alignment; line extraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5413459
Filename :
5413459
Link To Document :
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