• DocumentCode
    347590
  • Title

    Fast and robust registration of 3D surfaces using low curvature patches

  • Author

    Nguyen, Van-Duc ; Nzomigni, Victor ; Stewart, Charles V.

  • Author_Institution
    GE R&D, Schenectady, NY, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    201
  • Lastpage
    208
  • Abstract
    The paper describes a novel range data registration algorithm, specifically designed for accuracy, speed, and robustness. Like many recent registration techniques, our Robust-Closest-Patch algorithm (RCP) iteratively matches model patches to data surfaces based on the current pose and then re-estimates pose based on these matches. RCP has several novel features: 1) online registration is driven by low curvature patches computed from the model offline; 2) an approximate normal distance between a patch and a surface is used, avoiding the need to estimate local surface normal and curvature from noisy data; 3) pose is solved exactly by a linear system in six parameters, using a symmetric formulation of the rotation constraint; 4) robustness is ensured using an M-estimator that estimates both the rigid pose parameters and the error standard deviation. Results are shown using models and range data from turbine blade inspection
  • Keywords
    computational geometry; image matching; image registration; 3D surfaces; M-estimator; Robust-Closest-Patch algorithm; approximate normal distance; current pose; data surfaces; error standard deviation; linear system; local surface normal; low curvature patches; model patch matching; noisy data; online registration; pose; range data; range data registration algorithm; registration techniques; rigid pose parameters; robust registration; rotation constraint; symmetric formulation; turbine blade inspection; Blades; Coordinate measuring machines; Current measurement; Inspection; Linear systems; Noise shaping; Read only memory; Robustness; Sensor systems; Shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3-D Digital Imaging and Modeling, 1999. Proceedings. Second International Conference on
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    0-7695-0062-5
  • Type

    conf

  • DOI
    10.1109/IM.1999.805350
  • Filename
    805350