DocumentCode :
3476369
Title :
Status of the na determination by counting atoms in silicon crystals
Author :
Becker, P. ; Bettin, H. ; Borys, M. ; Busch, I. ; Fujii, K. ; Gray, M. ; Krumrey, M. ; Kuetgens, U. ; Mana, G. ; Manson, P. ; Massa, E. ; Nicolaus, A. ; Picard, A. ; Schiel, D. ; Valkiers, S.
Author_Institution :
PTB - Phys.-Tech. Bundesanstalt, Braunschweig, Germany
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
107
Lastpage :
108
Abstract :
This paper reports the progress and the achievements of an international research project aimed at determining the Avogadro constant by counting the atoms in enriched 28Si spheres.
Keywords :
constants; particle counting; silicon; 28Si; Avogadro constant; atom counting; enriched 28Si spheres; international research project; silicon crystals; Atomic measurements; Calibration; Crystals; Lattices; Measurement uncertainty; Optical interferometry; Pollution measurement; Silicon; Surface contamination; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5544257
Filename :
5544257
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3476369
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