• DocumentCode
    347654
  • Title

    Testing reusable IP-a case study

  • Author

    Harrod, Peter

  • Author_Institution
    ARM Ltd., Cambridge, UK
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    493
  • Lastpage
    498
  • Abstract
    This paper discusses the test strategies that can be employed for testing reusable Intellectual Property (IP). A typical System on Chip (SoC) design carried out at ARM is presented as a case study. It highlights the challenges faced when integrating IP blocks from diverse sources. A hybrid approach was found to be the most pragmatic solution, mixing bus-based, functional, scan and at-speed testing. The paper concludes with a look at how the task of resting reusable IP will benefit from industry standardisation efforts
  • Keywords
    automatic testing; boundary scan testing; computer testing; design for testability; embedded systems; industrial property; microprocessor chips; production testing; standardisation; ARM; at-speed testing; bus-based testing; functional testing; hybrid testing; industry standardisation; reusable IP; reusable Intellectual Property; scan testing; system on chip design; Automatic test pattern generation; Computer aided software engineering; Intellectual property; Job production systems; Libraries; Licenses; System testing; System-on-a-chip; Time factors; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805772
  • Filename
    805772