DocumentCode
347654
Title
Testing reusable IP-a case study
Author
Harrod, Peter
Author_Institution
ARM Ltd., Cambridge, UK
fYear
1999
fDate
1999
Firstpage
493
Lastpage
498
Abstract
This paper discusses the test strategies that can be employed for testing reusable Intellectual Property (IP). A typical System on Chip (SoC) design carried out at ARM is presented as a case study. It highlights the challenges faced when integrating IP blocks from diverse sources. A hybrid approach was found to be the most pragmatic solution, mixing bus-based, functional, scan and at-speed testing. The paper concludes with a look at how the task of resting reusable IP will benefit from industry standardisation efforts
Keywords
automatic testing; boundary scan testing; computer testing; design for testability; embedded systems; industrial property; microprocessor chips; production testing; standardisation; ARM; at-speed testing; bus-based testing; functional testing; hybrid testing; industry standardisation; reusable IP; reusable Intellectual Property; scan testing; system on chip design; Automatic test pattern generation; Computer aided software engineering; Intellectual property; Job production systems; Libraries; Licenses; System testing; System-on-a-chip; Time factors; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805772
Filename
805772
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